TS 75 TriboScope™
The next generation nanomechanical test instrument interfaced to your AFM
The TS 75 is a fully integrated AFM attachment surpassing the lower limit of traditional nanomechanical testing. The increased performance and testing speed of the TS 75 comfortably establishes itself as the next generation of nanomechanical testing devices, allowing researchers to:
• Obtain quantitative mechanical properties
• Reliably test softer materials
• Accurately test smaller volumes of material
• Achieve a faster sample throughput
In-situ SPM imaging
The in-situ SPM imaging capability of the TS 75 is critical for precise test placement and microstructure identification. The in-situ images are obtained by raster scanning the indenter probe over the sample surface and can be used to reliably place a test within 10nm of the desired testing location. This technique allows for effortless pre- and post- test topographical imaging without the need to reposition an auxiliary imaging instrument over the nanoscale testing site. The force and displacement results acquired during the test, in conjunction with the in-situ imaging capability, offer an unparalleled wealth of information concerning the material deformation behavior and mechanical properties of the material.
Unprecedented performance
The TS 75 nanomechanical test instrument is driven by the NEW performech™ DSP embedded controller, providing unsurpassed performance and industry- leading sensitivity. The performech controller boasts a sub 30nN force noise floor and 25X faster feedback control than the previous generation controller. The compact design of the Hysitron capacitive transducer allows it to be easily interfaced with most commercial AFM systems within minutes. The Hysitron transducer replaces the SPM detector assembly and provides topographic feedback for imaging. Utilizing the same indenter probe to obtain in-situ SPM images as to perform the nanoindentation experiment guarantees quantitative and repeatable data. Additionally, the transducer utilizes a rigid indenter which unlike cantilever based systems provides direct force and displacement measurements resulting in accurate and quantifiable results.
The TS 75 also supports the NEW RAPIDprobeTM transducer, which provides further increased sensitivity, a higher mechanical bandwidth, and faster SPM imaging than the previous generation transducer. The TS 75 is the highest performing nanomechanical test instrument on the market today.