The TI 750D nanomechanical test instrument is a dedicated tool for nanoscale dynamic mechanical property measurements. The TI 750D incorporates Hysitron's nanoDMA® III testing technology to determine nanoscale mechanical properties as a function of contact depth, frequency, and time. The system is equipped with the latest design of Hysitron's patented capacitive transducer technology, which has been fully optimized for highly sensitive dynamic measurements. The TI 750D is also capable of performing quasi-static nanoindentation, in-situ SPM imaging, and nanoscale wear testing with industry-leading sensitivity, reliability, and performance. Motorized staging along with intuitive, automated software routines reduce time to results while simplifying instrument operation.
The TI 750D allows the user to accurately and quantitatively characterize the nanoscale dynamic, quasi-static, and tribological properties of all classes of material. Hysitron's nanoDMA III with CMX and reference frequency control algorithms provides a powerful means of characterizing mechanical properties as a function of depth into the material's surface, viscoelastic properties as a function of frequency, and drift-free creep measurements.
Hysitron's patented capacitive transducer technology provides industry-leading performance and sensitivity for truly quantitative nanoscale characterization. TI 750D incorporates high-bandwidth nanoDMA III electronics for a greatly improved signal-to-noise ratio and faster testing cycles. Enhanced transducer dynamic characteristics and wide dynamic testing rang (0.1 Hz to 300 Hz) enables increased accuracy and applicability on the broadest range of materials. Coupled AC (dynamic) and DC (quasi-static) force modulation of the capacitive transducer ensures reliable and quantitative nanoscale dynamic characterization from the initial surface contact. This low-current and highly sensitive actuation method, exclusive to Hysitron technology, allows Hysitron instrumentation to achieve the highest levels of performance in the market.
In-Situ SPM Imaging
Precise positioning of the nanomechanical testing probe is required in order to obtain reliable and repeatable data from nanomechanical testing. Hysitron's patented in-situ SPM imaging provides high-resolution images at the location of the test by imaging with the same probe that performs the nanomechanical testing. This provides fundamental information regarding the pre-test surface topography of the test location and the resulting post-test deformation which would be unavailable without the image resolution offered by in-situ imaging. Hysitron's probe-scanning system allows imaging of any location on large samples or imaging of multiple samples without necessitating user intervention.
ScanningWear™ is a characterization technique that enables investigation into the wear resistance of coatings and films at the nanoscale. Wear tests are performed by raster scanning the probe across the sample with a user-defined contact force. By applying a known force and specifying the number of passes over which this force is applied to the sample surface, carefully-defined nanoscale wear tests can be designed. After ScanningWear tests have been performed, quantitative measurements of wear depths and volumes can be obtained using Hysitron's in-situ SPM imaging technique.
Hysitron's powerful CMX algorithms lie at the core of the TI 750D with nanoDMA III. CMX provides a quantitative and truly continuous measurement of mechanical properties - including hardness, storage modulus, loss modulus, complex modulus, and tan delta - as a function of indentation depth, frequency, and time. The TI 750D's force moduluation technique with CMX enables thousands of mechanical property measurements to be continuously taken during a single test, increases sensitivity to nanoscale elasto-plastic deformation and creep, and allows for the viscoelastic properties of materials to be measured.
In-Situ Drift Correction
The TI 750D incorporates a unique reference frequency technique for thermal drift correction during the course of an experiment. The reference frequency technique allows for the measurement of contact area without relying on the raw displacement data. Measured stiffness is proportional to contact area and can therefor be used to accurately determine contact area and contact depth in-situ. This allows for long duration frequency sweeps and creep tests to be reliably performed.
Hysitron's TI 750D Ubi features:
- Hysitron’s patented capacitive transducer for industry-leading sensitivity and stability
- Hysitron's Digital Controller for high precision force or displacement controlled nanomechanical testing
- Automated testing for high throughput and statistical sampling of material properties
- In-situ imaging for nanometer precision positioning and topography measurements
- Acoustic and thermal enclosure, along with stable transducer design, for minimal set-up and stablization time
- Passive vibration dampening system ensure low noise and uncompromised sensitivity
- Staging with sub-micron resolution for accurate sample positioning
- Numerous add-ons that allow the widest array of testing capabilities in the market
View the TI 750 Comparison Chart, TI 750L Ubi, or the TI 750H Ubi