Explore new frontiers in nanomechanical testing.

The PI 95 TEM PicoIndenter^® from Hysitron, Inc. is the first full-fledged depth-sensing indenter capable of direct-observation nanomechanical testing in a transmission electron microscope (TEM). This pioneering in-situ instrument is specifically designed to overcome the numerous configurational and environmental challenges presented by TEMs, and its primary function is to output a quantitative force-displacement curve to be time correlated to the corresponding TEM movie of the stress-induced deformation process. This coupling of high-resolution techniques enables a researcher to witness, for example, the microscopic origin of a measured force or displacement transient.

Compelling, novel in-situ technology

The key enabling technology of the PI 95 TEM PicoIndenter instrument is its novel miniature transducer. With this newly-developed transducer, in-situ force-displacement curves can be acquired in a highly accurate depth-sensing manner, instead of relying on an inherently troublesome series-loading, spring-deflection-force scheme. Furthermore, substantially larger forces can be realized on account of the electrostatic actuation aspect of the transducer, without suffering a force sensitivity penalty. Control of the transducer, and of the piezoelectric actuator, is governed by a newly-developed advanced digital controller operating at a high loop rate.

Highlights

• Patent-pending miniature transducer providing electrostatic actuation and capacitive displacement sensing
• TEM holder equipped with a three-axis coarse positioner and a 3D piezoelectric actuator for fine positioning
• Advanced digital controller utilizing a digital signal processor (DSP)
• Multiple operating modes including closed-loop displacement control, open-loop load control, and closed-loop force-balance control
• Actively damped transducer when operating under closed-loop control
• Easily interchangeable conductive probes and explicit means for preventing probe charging

PI 95 TEM PicoIndenter instrument PDF

	PDF (0.6 MB)	Performech DSP controller
	PDF (0.8 MB)	Nanoparticle Fracture In-situ testing of hollow CdS Nanospheres
	PDF (0.6 MB)	In-situ compression of nanopillars in transmission electron microscope

The PI 85 SEM PicoIndenter® is a depth-sensing indenter that can be interfaced with a scanning electron microscope (SEM). With this system it is possible to perform quantitative nanomechanical testing while simultaneously imaging with the SEM. Coupling these two techniques allows the researcher to position the probe extremely accurately and to image the deformation process throughout the test.

This system is designed for exceptional performance in the electron microscope, with a vacuum-compatible transducer and a conductive boron-doped diamond probe. With Hysitron's 3-plate capacitive transducer, force is applied electrostatically and displacement is measured capacitively. This low-current design provides low thermal drift and industry-leading stability and sensitivity.

The PI 85 system is ideal for characterizing fracture onset and crack propagation, delamination, and pile-up. Also, time-sensitive phenomena such as viscoelastic behavior can be observed in real time rather than "post mortem." The pairing of these two high-resolution techniques provides unique insight into the mechanisms responsible for materials behavior.

For more details on PI 85 SEM PicoIndenter - click here.

	PDF (0.6 MB)	Performech DSP controller
	PDF (0.8 MB)	In-Situ Micropillar Compression in scanning electron microscope

Click here to access the PicoIndenter Legal Notice