PI Series PicoIndenters | In-Situ Nanomechanics in the TEM or SEM

PI 95 TEM | Transmission Electron Microscope

TI 950 TriboIndenter | Nanoindentation Testing

Nanomechanics Laboratory | Materials Research

PI 85 SEM | Scanning Electron Microscope

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Hysitron PI 85 SEM PicoIndenter | Nanoindentation & Nanomechanical Test Instrument

Hysitron PI 87 SEM PicoIndenter | Nanoindentation & Nanomechanical Test Instrument

PI 95 TEM PicoIndenter^®

PI 85 SEM PicoIndenter^®

PI 87 SEM PicoIndenter^®

For use with existing transmission electron microscope (TEM) systems.

Use the PI 95 TEM PicoIndenter to easily add quantitative indentation to the following compatible transmission electron microscope (TEM) models:

JEOL
FEI (Philips)
Hitachi
Zeiss (LEO)
Contact Hysitron for compatibility with other transmission electron microscope models

Transducer Specifications:
>1000 µN maximum force
5000 nm maximum displacement
~0.2 µN RMS Force Noise Floor
~1 nm RMS Displacement Noise Floor

Applications:
Dislocation burst studies
Phase transformation studies
Spalling
Shear banding or fracture onset

For use with existing scanning electron microscope (SEM) systems.

Use the PI 85 SEM PicoIndenter to easily add quantitative indentation to the following scanning electron microscope (SEM) models:

JEOL
FEI (Philips)
Hitachi
TESCAN
Zeiss (LEO)
Contact Hysitron for compatibility with other scanning electron microscope models

Transducer Specifications:
30 mN maximum load
≤ 3 nN Load Resolution
≤ 400 nN RMS Force Noise Floor
≤ 0.02 nm Displacement Resolution
≤ 1 nm RMS Displacement Noise Floor

Applications:
Material recovery study via deformation imaging
Location specific testing via accurate probe placement in multi-phase materials
In-situ compression studies
To study interfacial grain boundaries

For use with existing scanning electron microscope (SEM) systems.

Use the PI 87 SEM PicoIndenter for mechanical testing with 5 degrees of freedom for sample positioning. Compatible with the following scanning electron microscope (SEM) models:

JEOL
FEI (Philips)
Hitachi
TESCAN
Zeiss (LEO)
Contact Hysitron for compatibility with other scanning electron microscope models

Transducer Specifications:
30 mN maximum load
≤ 3 nN Load Resolution
≤ 400 nN RMS Force Noise Floor
≤ 0.02 nm Displacement Resolution
≤ 1 nm RMS Displacement Noise Floor

Applications:
EBSD studies of grain structure and crystallographic orientation
Sample preparation or modification via FIB
Superior sample alignment for mechanical testing
CTE mismatch in copper TSV's

Hysitron’s newest product line addition, the PI Series is a depth-sensing indentation tool that can be interfaced with many common transmission electron microscope and scanning electron microscope systems. The Hysitron PI Series includes the PI 95 TEM PicoIndenter, PI 85 SEM PicoIndenter, and PI 87 SEM PicoIndenter.

PI 95 TEM PicoIndenter
The first depth-sensing indentation tool produced for a transmission electron microscope (TEM). The PI 95 is capable of direct observation nanomechanical testing and utilizes the advanced performech DSP control unit.

PI 85 SEM PicoIndenter
The PI 85 interfaces with common scanning electron microscope systems to allow for quantitative nanomechanical testing while simultaneously imaging with the scanning electron microscope (SEM). The PI 85 utilizes the advanced performech DSP control unit.

PI 87 SEM PicoIndenter
The PI 87 interfaces with common scanning electron microscope systems to allow for quantitative nanomechanical testing while leveraging additional SEM capabilities such as FIB, EBSD, EDS, WDS, etc. The PI 87 utilizes the advanced performech DSP control unit.