Modulus Mapping incorporates the quantitative measurements of viscoelastic properties provided by nanoDMA^® with the in-situ imaging of Hysitron's testing instruments to yield unprecedented capabilities in nanomechanical testing. This tool provides a modulus map of a surface from a single SPM scan, eliminating the need for thousands of indents to characterize an area.

The Hysitron Modulus Mapping option features:

• High-resolution modulus mapping of material interfaces
• 65,536 nanomechanical tests in less than ten minutes
• Automated calibration of entire system
• Stand-alone software platform
• Advanced offline image analysis software
• Quantitative maps of storage and loss stiffness and modulus